Circuits and System Descriptions, Algorithms and Data Structures, Verification, Test Pattern Generation, New Technologies
Published at: Information Processing Letters (Volume: 190)
DOI: 10.1016/j.ipl.2025.106571
Published at: ACM Transactions on Design Automation of Electronic Systems (Volume: 30)
DOI: 10.1145/3715323
Published at: Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences (Volume: 383)
DOI: 10.1098/rsta.2023.0390
Published at: 2025 IEEE 26th Latin American Test Symposium Lats 2025
DOI: 10.1109/LATS65346.2025.10963945
Published at: IEEE Transactions on Evolutionary Computation
DOI: 10.1109/TEVC.2025.3569778
Published at: IEEE Transactions on Nanotechnology (Volume: 24)
DOI: 10.1109/TNANO.2025.3548265
Published at: Proceedings Design Automation and Test in Europe Date
DOI: 10.23919/DATE64628.2025.10992946
Published at: Proceedings Design Automation and Test in Europe Date
DOI: 10.23919/DATE64628.2025.10992829
Published at: Proceedings 2025 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems Ddecs 2025
DOI: 10.1109/DDECS63720.2025.11006790
Published at: Proceedings 2025 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems Ddecs 2025
DOI: 10.1109/DDECS63720.2025.11006767