Circuits and System Descriptions, Algorithms and Data Structures, Verification, Test Pattern Generation, New Technologies
Published at: ACM Transactions on Design Automation of Electronic Systems (Volume: 31)
DOI: 10.1145/3771280
Published at: Microprocessors and Microsystems (Volume: 118)
DOI: 10.1016/j.micpro.2025.105199
Published at: ACM Transactions on Design Automation of Electronic Systems (Volume: 30)
DOI: 10.1145/3733237
Published at: Formal Methods in System Design (Volume: 67)
DOI: 10.1007/s10703-024-00452-3
Published at: Information Processing Letters (Volume: 190)
DOI: 10.1016/j.ipl.2025.106571
Published at: ACM Journal on Emerging Technologies in Computing Systems (Volume: 21)
DOI: 10.1145/3729229
Published at: ACM Transactions on Design Automation of Electronic Systems (Volume: 30)
DOI: 10.1145/3744710
Published at: ACM Transactions on Design Automation of Electronic Systems (Volume: 30)
DOI: 10.1145/3715323
Published at: Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences (Volume: 383)
DOI: 10.1098/rsta.2023.0390
Published at: 2025 IEEE 26th Latin American Test Symposium Lats 2025
DOI: 10.1109/LATS65346.2025.10963945